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"Mutation-Based Generation of Software Product Line Test Configurations."

Christopher Henard, Mike Papadakis, Yves Le Traon (2014)

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DOI: 10.1007/978-3-319-09940-8_7

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Christopher Henard, Mike Papadakis, Yves Le Traon:
Mutation-Based Generation of Software Product Line Test Configurations. SSBSE 2014: 92-106

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