"A Framework for IoT-Based Monitoring and Diagnosis of Manufacturing Systems."

I-Ling Yen et al. (2017)

Details and statistics

DOI: 10.1109/SOSE.2017.26

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics