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"Low complexity rate compatible puncturing patterns design for LDPC codes."

Fulvio Babich et al. (2017)

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DOI: 10.23919/SOFTCOM.2017.8115558

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

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  dblp key:
  - conf/softcom/BabichNSV17
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  - https://dblp.org/rec/conf/softcom/BabichNSV17
Fulvio Babich, Matteo Noschese, Alessandro Soranzo, Francesca Vatta:
Low complexity rate compatible puncturing patterns design for LDPC codes. SoftCOM 2017: 1-5

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