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"Context-specific leakage and delay analysis of a 65nm standard cell ..."

Darsun Tsiena et al. (2007)

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DOI: 10.1109/SOCC.2007.4545471

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Darsun Tsiena, Chien Kuo Wang, William W. J. Wang, Yajun Ran, Philippe Hurat, Nishath Verghese:
Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability. SoCC 2007: 261-268

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