"A SAR ADC BIST for simplified linearity test."

An-Sheng Chao, Soon-Jyh Chang, Hsin-Wen Ting (2011)

Details and statistics

DOI: 10.1109/SOCC.2011.6085122

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics