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"A two-step Pansharpening of ETM+ TIR image based on SFIM and neural ..."

Min Han, Wei Yao (2009)

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DOI: 10.1109/ICSMC.2009.5346259

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-22

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Min Han, Wei Yao:
A two-step Pansharpening of ETM+ TIR image based on SFIM and neural network regression. SMC 2009: 1371-1375

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