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"Selective Fault-Masking for Improving Yield and Performance of On-Chip ..."

Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas (2021)

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DOI: 10.1109/SMC52423.2021.9658774

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-11

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Biswajit Bhowmik, Jatindra Kumar Deka, Santosh Biswas:
Selective Fault-Masking for Improving Yield and Performance of On-Chip Networks. SMC 2021: 3336-3341

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