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"A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm ..."

F. J. Rubio-Barbero et al. (2023)

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DOI: 10.1109/SMACD58065.2023.10192247

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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F. J. Rubio-Barbero, Eros Camacho-Ruiz, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF. SMACD 2023: 1-4

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