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"TARS: A toolbox for statistical reliability modeling of CMOS devices."

Javier Diaz-Fortuny et al. (2017)

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DOI: 10.1109/SMACD.2017.7981601

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  - conf/smacd/Diaz-FortunyMRN17
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  - https://dblp.org/rec/conf/smacd/Diaz-FortunyMRN17
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
TARS: A toolbox for statistical reliability modeling of CMOS devices. SMACD 2017: 1-4

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