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"Impact of Process Variations on the Performance of a Widely Tunable CMOS ..."

Israel Corbacho et al. (2022)

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DOI: 10.1109/SMACD55068.2022.9816190

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Israel Corbacho, Juan M. Carrillo, José L. Ausín, Miguel Angel Domínguez, Raquel Pérez-Aloe, J. Francisco Duque-Carrillo:
Impact of Process Variations on the Performance of a Widely Tunable CMOS Transconductor. SMACD 2022: 1-4

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