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"Robustness of sift feature descriptors to imaging parameters in laser ..."

Devrim Ünay, Stefan G. Stanciu (2018)

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DOI: 10.1109/SIU.2018.8404623

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

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Devrim Ünay, Stefan G. Stanciu:
Robustness of sift feature descriptors to imaging parameters in laser scanning microscopy. SIU 2018: 1-4

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