"Test-related factors and post-release defects: an empirical study."

Fabiano Pecorelli (2019)

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DOI: 10.1145/3338906.3342500

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Fabiano Pecorelli:
Test-related factors and post-release defects: an empirical study. ESEC/SIGSOFT FSE 2019: 1235-1237

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