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"YOLO-IMF: An Improved YOLOv8 Algorithm for Surface Defect Detection in ..."

Ziqiang Liu, Kejiang Ye (2023)

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DOI: 10.1007/978-3-031-44754-9_2

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-28

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  dblp key:
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Ziqiang Liu, Kejiang Ye:
YOLO-IMF: An Improved YOLOv8 Algorithm for Surface Defect Detection in Industrial Manufacturing Field. METAVERSE 2023: 15-28

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