"Computational simulation of electromigration induced damage in copper ..."

Cemal Basaran, Minghui Lin, Shidong Li (2007)

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type: Conference or Workshop Paper

metadata version: 2018-11-28

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Cemal Basaran, Minghui Lin, Shidong Li:
Computational simulation of electromigration induced damage in copper interconnects. SCSC 2007: 261-268

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