Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low ..."

Marampally Saikiran, Mona Ganji, Degang Chen (2022)

> Home

Details and statistics

DOI: 10.1109/SBCCI55532.2022.9893243

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/sbcci/SaikiranGC22a
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/sbcci/SaikiranGC22a
Marampally Saikiran, Mona Ganji, Degang Chen:
Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators. SBCCI 2022: 1-6

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.