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"Reliability by Design: Avoiding Migration-Induced Failure in IC Interconnects."

Susann Rothe, Jens Lienig (2022)

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DOI: 10.1109/SBCCI55532.2022.9893237

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-01

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  dblp key:
  - conf/sbcci/RotheL22
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  - https://dblp.org/rec/conf/sbcci/RotheL22
Susann Rothe, Jens Lienig:
Reliability by Design: Avoiding Migration-Induced Failure in IC Interconnects. SBCCI 2022: 1-6

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