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"A test chip for automatic MOSFET mismatch characterization."

Hamilton Klimach, Márcio C. Schneider, Carlos Galup-Montoro (2006)

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DOI: 10.1145/1150343.1150369

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  - conf/sbcci/KlimachSG06
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Hamilton Klimach, Márcio C. Schneider, Carlos Galup-Montoro:
A test chip for automatic MOSFET mismatch characterization. SBCCI 2006: 83-88

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