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"Reducing Test Application Time through Interleaved Scan."

Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero (2002)

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DOI: 10.5555/827246.827387

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-10

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  dblp key:
  - conf/sbcci/CornoRS02
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  - https://dblp.org/rec/conf/sbcci/CornoRS02
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero:
Reducing Test Application Time through Interleaved Scan. SBCCI 2002: 89-94

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