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"16NM 6T and 8T CMOS SRAM Cell Robustness Against Process Variability and ..."

Roberto B. Almeida, Paulo F. Butzen, Cristina Meinhardt (2018)

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DOI: 10.1109/SBCCI.2018.8533253

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
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Roberto B. Almeida, Paulo F. Butzen, Cristina Meinhardt:
16NM 6T and 8T CMOS SRAM Cell Robustness Against Process Variability and Aging Effects. SBCCI 2018: 1-6

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