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"Estimating testability and coverage distributions of a VLSI circuit from a ..."

Hassan Farhat, Mansour Zand, Hossein Saiedian (1992)

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DOI: 10.1145/143559.143672

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  - conf/sac/FarhatZS92
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Hassan Farhat, Mansour Zand, Hossein Saiedian:
Estimating testability and coverage distributions of a VLSI circuit from a mixture of discrete and continuous functions. SAC 1992: 433-437

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