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"GAN-based Defect Image Generation for Imbalanced Defect Classification of ..."

Yongmoon Jeon et al. (2022)

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DOI: 10.2312/SR.20221164

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-20

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  dblp key:
  - conf/rt/JeonKLJK22
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Yongmoon Jeon, Haneol Kim, Hyeona Lee, Seonghoon Jo, Jaewon Kim:
GAN-based Defect Image Generation for Imbalanced Defect Classification of OLED panels. EGSR (ST) 2022: 145-150

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