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"High-level test generation for processing elements in many-core systems."

Stephen Adeboye Oyeniran et al. (2017)

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DOI: 10.1109/RECOSOC.2017.8016156

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  dblp key:
  - conf/recosoc/OyeniranUAR17
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  persistent URL:
  - https://dblp.org/rec/conf/recosoc/OyeniranUAR17
Stephen Adeboye Oyeniran, Raimund Ubar, Siavoosh Payandeh Azad, Jaan Raik:
High-level test generation for processing elements in many-core systems. ReCoSoC 2017: 1-8

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