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"Enhancing Semiconductor Chip Image Defect Classification Using Deep ..."

Xiaoyan Zheng et al. (2023)

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DOI: 10.1109/CIS-RAM55796.2023.10370751

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-16

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Xiaoyan Zheng, Tong Sang, Ruohui Chen, Zeng Zeng:
Enhancing Semiconductor Chip Image Defect Classification Using Deep Learning and Segmented Defect Region Information. CIS-RAM 2023: 204-209

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