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"AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart ..."

Qing Han et al. (2023)

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DOI: 10.1109/CIS-RAM55796.2023.10370990

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-16

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  dblp key:
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Qing Han, Yu Xia, Xiupeng Shi, Zeng Zeng:
AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing. CIS-RAM 2023: 180-185

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