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"Process-variation Effects on 3D TLC Flash Reliability: Characterization ..."

Yuqian Pan et al. (2020)

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DOI: 10.1109/QRS51102.2020.00051

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-08

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  dblp key:
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Yuqian Pan, Haichun Zhang, Mingyang Gong, Zhenglin Liu:
Process-variation Effects on 3D TLC Flash Reliability: Characterization and Mitigation Scheme. QRS 2020: 329-334

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