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"Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault ..."
Wei Cheng et al. (2019)
- Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley:
Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection. PROOFS 2019: 17-32
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