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"Nearest neighbor sampling for better defect prediction."

Gary D. Boetticher (2005)

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DOI: 10.1145/1083165.1083173

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-26

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Gary D. Boetticher:
Nearest neighbor sampling for better defect prediction. PROMISE@ICSE 2005: 4:1-4:6

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