"Diagonal Symmetric Pattern Based Illumination Invariant Measure for Severe ..."

Changhui Hu et al. (2020)

Details and statistics

DOI: 10.1007/978-3-030-60639-8_3

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-05

a service of  Schloss Dagstuhl - Leibniz Center for Informatics