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"Small Defect Detection in Industrial X-Ray Using Convolutional Neural Network."

Long Cheng et al. (2019)

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DOI: 10.1007/978-3-030-31726-3_31

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-30

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  dblp key:
  - conf/prcv/ChengGQWL19
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  - https://dblp.org/rec/conf/prcv/ChengGQWL19
Long Cheng, Ping Gong, Guanghui Qiu, Jing Wang, Ziyuan Liu:
Small Defect Detection in Industrial X-Ray Using Convolutional Neural Network. PRCV (3) 2019: 366-377

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