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"Using Explainable Boosting Machines (EBMs) to Detect Common Flaws in Data."

Zhi Chen et al. (2021)

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DOI: 10.1007/978-3-030-93736-2_40

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-10

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  dblp key:
  - conf/pkdd/ChenTNILC21
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  - https://dblp.org/rec/conf/pkdd/ChenTNILC21
Zhi Chen, Sarah Tan, Harsha Nori, Kori Inkpen, Yin Lou, Rich Caruana:
Using Explainable Boosting Machines (EBMs) to Detect Common Flaws in Data. PKDD/ECML Workshops (1) 2021: 534-551

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