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"Test Set Embedding into Low-Power BIST Sequences Using Maximum Bipartite ..."

Ioannis Voyiatzis et al. (2012)

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DOI: 10.1109/PCI.2012.75

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Ioannis Voyiatzis, Kyriakos Axiotis, Nikolaos S. Papaspyrou, Hera Antonopoulou, Costas Efstathiou:
Test Set Embedding into Low-Power BIST Sequences Using Maximum Bipartite Matching. Panhellenic Conference on Informatics 2012: 74-79

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