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"Gate leakage current accurate models for nanoscale MOSFET transistors."

Abdoul Rjoub, Nedal Al Taradeh, Mamoun F. Al-Mistarihi (2014)

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DOI: 10.1109/PATMOS.2014.6951880

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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  - conf/patmos/RjoubTA14
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Abdoul Rjoub, Nedal Al Taradeh, Mamoun F. Al-Mistarihi:
Gate leakage current accurate models for nanoscale MOSFET transistors. PATMOS 2014: 1-4

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