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"2018 3rd International Conference on Pattern Analysis and Intelligent ..."

Mohamed Amroune, Makhlouf Derdour, Ahmed Ahmim (2018)

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DOI: —

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type: Editorship

metadata version: 2019-10-16

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Mohamed Amroune, Makhlouf Derdour, Ahmed Ahmim:
2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS), Tebessa, Algeria, October 24-25, 2018. IEEE 2018, ISBN 978-1-5386-4238-2 [contents]

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