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"Mutation analysis vs. code coverage in automated assessment of students' ..."

Kalle Aaltonen, Petri Ihantola, Otto Seppälä (2010)

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DOI: 10.1145/1869542.1869567

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-21

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Kalle Aaltonen, Petri Ihantola, Otto Seppälä:
Mutation analysis vs. code coverage in automated assessment of students' testing skills. SPLASH/OOPSLA Companion 2010: 153-160

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