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"Memory Mapped I/O Register Test Case Generator for Large Systems-on-Chip."

Roni Hämäläinen, Henri Lunnikivi, Timo Hämäläinen (2023)

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DOI: 10.1109/NORCAS58970.2023.10305453

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  dblp key:
  - conf/norcas/HamalainenLH23
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  - https://dblp.org/rec/conf/norcas/HamalainenLH23
Roni Hämäläinen, Henri Lunnikivi, Timo Hämäläinen:
Memory Mapped I/O Register Test Case Generator for Large Systems-on-Chip. NorCAS 2023: 1-7

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