"Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on ..."

Olivier Occello et al. (2024)

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DOI: 10.1109/NEWCAS58973.2024.10666369

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-07

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Olivier Occello, Marc Margalef-Rovira, Manuel J. Barragan Asian, C. Durand, A. Rhellab, Loic Vincent, Jordan Corsi, Sylvie Lépilliet, G. Ducournau, P. Ferrari:
Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests. NewCAS 2024: 79-83

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