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"A study on accelerated built-in self test of multi-Gb/s high speed interfaces."

Seong-Won Kang et al. (2011)

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DOI: 10.1109/NESEA.2011.6144937

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/nesea/KangCJK11
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  persistent URL:
  - https://dblp.org/rec/conf/nesea/KangCJK11
Seong-Won Kang, Jung-Hoon Chun, Young-Hyun Jun, Kee-Won Kwon:
A study on accelerated built-in self test of multi-Gb/s high speed interfaces. NESEA 2011: 1-4

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