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"A Bayesian Demonstration of Reliability for Encapsulated Implanted ..."

Callum Lamont, Federico Mazza, Nick Donaldson (2019)

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DOI: 10.1109/NER.2019.8717034

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/ner/LamontMD19
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Callum Lamont, Federico Mazza, Nick Donaldson:
A Bayesian Demonstration of Reliability for Encapsulated Implanted Electronics. NER 2019: 730-733

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