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"Investigation of Reproducibility and Repeatability Issue on EFT Test at IC ..."

Jianwei Su et al. (2013)

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DOI: 10.1007/978-3-642-41635-4_18

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-27

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  dblp key:
  - conf/nccet/SuLWW13
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Jianwei Su, Jiancheng Li, Jianfei Wu, Chunming Wang:
Investigation of Reproducibility and Repeatability Issue on EFT Test at IC Level to Microcontrollers. NCCET 2013: 171-179

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