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"Simple and Low-Cost Measurement Test Setup to Determine the RF, LO and IF ..."

C. Perez-Wences, José Raúl Loo-Yau, Pablo Moreno (2019)

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DOI: 10.1109/MWSCAS.2019.8884891

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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C. Perez-Wences, José Raúl Loo-Yau, Pablo Moreno:
Simple and Low-Cost Measurement Test Setup to Determine the RF, LO and IF Impedances for Designing GaN FET Resistive Mixer. MWSCAS 2019: 544-547

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