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"Accurate sensor readout circuitry for reliability measurement of ..."

Kushal Das, Torsten Lehmann, Cesar Ramos Rodrigues (2013)

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DOI: 10.1109/MWSCAS.2013.6674651

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-23

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Kushal Das, Torsten Lehmann, Cesar Ramos Rodrigues:
Accurate sensor readout circuitry for reliability measurement of hermetically sealed chip-scale biomedical implants. MWSCAS 2013: 325-328

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