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"Comparison of Electrical and Reliability Characteristics of Different ..."

Jia-Lin Wu et al. (2006)

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DOI: 10.1109/MTDT.2006.8

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/mtdt/WuCLWLWCHPCK06
Jia-Lin Wu, Hua-Ching Chien, Chien-Wei Liao, Cheng-Yen Wu, Chih-Yuan Lee, Houng-Chi Wei, Shih-Hsien Chen, Hann-Ping Hwang, Saysamone Pittikoun, Travis Cho, Chin-Hsing Kao:
Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory. MTDT 2006: 80-84

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