"Built-in Self-Test and Repair (BISTR) Techniques for Embedded RAMs."

Shyue-Kung Lu, Shih-Chang Huang (2004)

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DOI: 10.1109/MTDT.2004.7

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Shyue-Kung Lu, Shih-Chang Huang:
Built-in Self-Test and Repair (BISTR) Techniques for Embedded RAMs. MTDT 2004: 60-64

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