"The State-of-Art and Future Trends in Testing Embedded Memories."

Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor (2004)

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DOI: 10.1109/MTDT.2004.23

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Said Hamdioui, Georgi Gaydadjiev, Ad J. van de Goor:
The State-of-Art and Future Trends in Testing Embedded Memories. MTDT 2004: 54-59

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