"Realistic Fault Models and Test Procedures for Multi-Port SRAMs."

Said Hamdioui et al. (2001)

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DOI: 10.1109/MTDT.2001.945230

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Said Hamdioui, Ad J. van de Goor, David Eastwick, Mike Rodgers:
Realistic Fault Models and Test Procedures for Multi-Port SRAMs. MTDT 2001: 65-72

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