"Impact of stresses on the fault coverage of memory tests."

Said Hamdioui et al. (2005)

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DOI: 10.1109/MTDT.2005.26

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Rob Wadsworth:
Impact of stresses on the fault coverage of memory tests. MTDT 2005: 103-108

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