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"Failure Mechanisms Detected in Memory Chips during Routine Construction ..."

Sue Brown et al. (1999)

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DOI: 10.1109/MTDT.1999.782681

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  persistent URL:
  - https://dblp.org/rec/conf/mtdt/BrownCGJH99
Sue Brown, Jeff Campbell, Sherri Griffin, Dick James, Ray Haythornthwaite:
Failure Mechanisms Detected in Memory Chips during Routine Construction Analysis. MTDT 1999: 34-39

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