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"FAVE: factor analysis based approach for detecting product line ..."

Kentaro Yoshimura et al. (2008)

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DOI: 10.1145/1370750.1370753

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/msr/YoshimuraNHK08
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  - https://dblp.org/rec/conf/msr/YoshimuraNHK08
Kentaro Yoshimura, Fumio Narisawa, Koji Hashimoto, Tohru Kikuno:
FAVE: factor analysis based approach for detecting product line variability from change history. MSR 2008: 11-18

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