"A Metric for the Measurement of Relative Susceptibility to Training Data ..."

Jonathan P. Bernick (2003)

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type: Conference or Workshop Paper

metadata version: 2003-10-10

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Jonathan P. Bernick:
A Metric for the Measurement of Relative Susceptibility to Training Data Noise for Multi-Layer Perceptrons. MLMTA 2003: 298-301

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