Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Topology-Driven Reliability Assessment of Integrated Circuits."

Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen (2018)

> Home

Details and statistics

DOI: 10.23919/MIXDES.2018.8436642

access: closed

type: Conference or Workshop Paper

metadata version: 2018-08-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/mixdes/HillebrandPP18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/mixdes/HillebrandPP18
Theodor Hillebrand, Steffen Paul, Dagmar Peters-Drolshagen:
Topology-Driven Reliability Assessment of Integrated Circuits. MIXDES 2018: 198-203

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.